Preprint reports agent-guided transistor-model calibration workflow

A preprint reports an agentic workflow for calibrating models of fabricated oxide semiconductor transistors. The authors say an LLM orchestrates parameter and model-selection steps while Sentaurus governs device physics. For a 2%-tungsten reference device, five agent-suggested updates reduced the reported multi-metric objective by 14.3 times, with tests across drain biases and channel lengths rather than only a local fit. The result is a preprint describing a laboratory modeling workflow, not a deployed production system.